Poreek BCT-210C Coating Thickness Gauge for Galvanized, Chrome, Copper, Enamel, and Carburized Layers

•Thickness gauge

Poreek BCT-210C Coating Thickness Gauge for Galvanized, Chrome, Copper, Enamel, and Carburized Layers

CN¥699.00

SKU: 100089562665

Status:In Stock (25)

ID: 100056738770

Weight: 1000.00 g

Dims:297x257x158 mm

Specifications

Material measurement: Coating, plating, paint film, paint, Metal
How it works: Split type
Display type: digital display
Category: coating thickness gauge

Variants / Sale Attributes

Model: BCT210C (FE Magnetic Probe)

Package Contents

BCT-210C Main Unit *1 Probe *1 Standard Plate *1 Battery *1 Base *1 Packaging Box *1 User Manual *1 Warranty Card *1 Certificate of Conformity *1

Product Description

Product Specifications

Overview

Brand: BRK Perike ()
Model: BCT-210C Coating Thickness Gauge

The BCT-210 series coating thickness gauge is a high-end, portable measuring instrument independently developed by Perike. It provides fast, non-destructive, and precise measurement of coating and plating thickness. Suitable for laboratory and field use, it supports multiple probe types to meet diverse measurement needs. Widely used in manufacturing, metal processing, chemical industry, and quality inspection.

Full Chinese interface for user-friendly operation

Additional details

Dual measurement methods: Magnetic induction and Eddy current
Compatible with three types of probes: Fe (ferrous), NFe (non-ferrous), and F10

Adjustable limit settings with automatic alarm for out-of-limit measurements

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Histogram analysis for batch measurement data

LCD display with switchable backlight

Menu-driven operation with error prompts via screen and buzzer

Manual and automatic power-off modes

International 9-pin socket for connectivity

Ergonomic integrated rear bracket for comfortable handheld operation

USB data interface for PC connection and data transfer

Magnetic induction for measuring non-magnetic coatings on ferrous substrates

Eddy current for measuring non-conductive coatings on non-ferrous metal substrates

1. Magnetic Induction Probes

Item	Detail
FE Probe	—
Measurement Range	0–1500 μm
Resolution	0.1 μm
Accuracy	±(2%H + 1 μm) single-point calibration; ±(1%H + 1 μm) two-point calibration
Minimum Convex Curvature Radius	1.5 mm
Minimum Area Diameter	7 mm
Critical Substrate Thickness	0.5 mm
F10 Probe	—
Measurement Range	0–10000 μm
Resolution	1 μm
Accuracy	±(2%H + 10 μm) single-point calibration; ±(1%H + 10 μm) two-point calibration
Minimum Convex Curvature Radius	10 mm
Minimum Area Diameter	40 mm
Critical Substrate Thickness	2 mm

2. Eddy Current Probe

Item	Detail
NFe Probe	—
Measurement Range	0–1500 μm
Resolution	0.1 μm
Accuracy	±(2%H + 1.5 μm) single-point calibration; ±(1%H + 1.5 μm) two-point calibration
Minimum Convex Curvature Radius	3 mm
Minimum Area Diameter	5 mm
Critical Substrate Thickness	0.3 mm